Circuits

An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns

By Gordon Roberts, Friedrich Taenzler, Mark Burns

With the proliferation of complicated semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, trendy engineer needs to be fluent in all 4 circuit forms. Written for complicated undergraduate and graduate-level scholars, in addition to engineering execs, An Introduction to Mixed-Signal IC attempt and Measurement, moment version, encompasses analog, mixed-signal and radio-frequency circuits assessments, with many correct business examples. The textual content assumes an exceptional heritage in analog and electronic circuits and a operating wisdom of pcs and desktop programming.

An advent to Mixed-Signal IC try out and Measurement, moment variation, contains examples and illustrations--featuring cutting-edge business technology--to enhance and brighten up the textual content. The publication additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added advantages of mixed-signal IC trying out to a manufacturer's product, and obviously defines the function of the attempt engineer.

New to This Edition
* a brand new bankruptcy on RF attempt equipment and basics of RF Testing
* a brand new bankruptcy on Clock and Serial information Communications Channel Measurements
* insurance of RF load board design
* New assurance of probabilistic reasoning for mixed-signal checking out

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Extra info for An Introduction to Mixed-Signal IC Test and Measurement

Example text

5. Relay coil driver with flyback protection diodes. 1 Digital Vectors A mixed-signal tester must test digital circuits as well as mixed-signal and analog circuits. The mixed-signal and digital-only sections of the DUT are exercised using the tester’s digital subsystem. The digital subsystem can present high, low, and high-impedance (HIZ) logic levels to the DUT. It can also compare the outputs from the DUT against expected responses to determine whether the digital logic of the DUT has been manufactured without defects.

Digital signals are distinct from digital vectors in that they typically carry analog signal information rather than purely digital information. Usually, the samples of a digital signal must be applied to a DUT along with a repetitive digital pattern that keeps the device active and initiates DAC and/or ADC conversions. Each cycle of the repeating digital pattern is called a frame. During a mixed-signal test, the repeating frame vectors must be combined with the nonrepeating digital signal sample information to form a repetitive sampling loop.

Therefore, the purpose and functionality of a general-purpose relay matrix depends on the test engineer’s DIB design. It allows flexible interconnections between specific tester instruments and pins of the DUT through connections on the DIB board. 4. Instrument relay matrix. DIB connections Voltmeter + Voltmeter – DC source 1 DC source 2 DC source 3 DC source 4 D i g i t i ze r 1 Etc… Chapter 2 • Tester Hardware the DIB board. The exact architecture of relays, matrices, and signal paths varies widely from one ATE vendor’s tester to the next.

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